Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/1588
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Haner, James Lee | - |
dc.date.accessioned | 2025-03-24T12:01:58Z | - |
dc.date.available | 2025-03-24T12:01:58Z | - |
dc.date.issued | 2024 | - |
dc.identifier.isbn | 978-1-26-046760-4 | - |
dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/1588 | - |
dc.language.iso | en | en_US |
dc.publisher | McGraw-Hill | en_US |
dc.subject | project management | en_US |
dc.title | CAPM Certified Associate in Project Management All in One Exam Guide | en_US |
dc.type | Book | en_US |
Appears in Collections: | Project Management |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
_OceanofPDF.com_CAPM_Certified_Associate_in_Project_Management_All-in-One_Exam_Guide_-_James_Lee_Haner.pdf | 10.79 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.